Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...
Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost. The design-for-test (DFT) technology was ...
DeFacTo Technologies announced at the International Test Conference a new DFT product that analyzes a register-transfer level (RTL) integrated-circuit design, creates appropriate RTL scan-test ...
Design for testability (DFT), a way to build testability into an integrated circuit (IC) at the design stage to lower testing costs and increase manufacturing yield, has been around for many years in ...
HiDFT-Scan Analyzes, Implements Scan Test Structures in Register-Transfer Level Designs; Closes Historical Gap between RTL and DFT PALO ALTO, Calif.--October 22, 2007--DeFacTo Technologies today ...
Whether driven by or just sheer complexity, the way information is passed through the design and test flow is changing. For the past couple of process generations, there has been a concerted push by ...
SUNNYVALE, Calif., May 11, 2021 (GLOBE NEWSWIRE) -- Real Intent, Inc., today announced that the following static sign-off tools — Meridian RDC (Reset Domain Crossing), Meridian CDC (Clock Domain ...
Gainesville, FL – April 30, 2013 – The Athena Group, Inc., a leading provider of high-performance, low-power signal processing IP cores, today announced the availability of multiple new FFT/DFT ...
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