As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...

Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...

Freescale Semiconductor India Pvt. Ltd. Scannability has always been a challenge and with the complex architectures, challenges gets multifold by imposing several limitations like HOLD closure, yield ...

Scannability has always been a challenge and with complex architectures, the challenge is exacerbated by imposing several limitations like HOLD closure, yield loss, silicon failures due to HOLD, scan ...

At 0.13 microns and below, IC manufacturers are starting to see more defects that are not caught by traditional stuck-at-fault testing. Defects like high impedance metal, high impedance shorts, and ...